Deskripsi
Specification :
| Product Size | – |
| Baseline Flatness | ±0.0015 A (200–800 nm) 2.0 nm SBW, smoothed |
| Description | Evolution 350 Spectrophotometer |
| Detector Type | Dual Matched Silicon Photodiodes |
| Dimensions (L x W x H) | 53 x 61 x 38 cm / 20.8 x 24 x 14.9 in. |
| Drift | <0.0005 Abs/hour, 500 nm, 2.0 nm SBW, 2 hr warm-up |
| Electrical Requirements | 100–240 V, 50–60 Hz |
| For Use With (Application) | Academic, Chemicals, Food & Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals |
| Lamp | Xenon Flash Lamp Typical Lifetime: >5 years. Longer if not using live signal Warranty Period: 3 year source replacement warranty |
| Noise | Photometric
0A: <0.00018 A 1A: <0.00022 A 2A: <0.00050 A 500 nm, 2.0 nm SBW, RMS |
| Optical Design | Modified Ebert; Double beam with sample and reference cuvette/accessory positions |
| Pharmacopoeia Compliance Testing | Resolution (Toluene in Hexane) Peak/Trough Ratio >1.8 with 1nm slit setting
Photometric Accuracy (60mg/L K2Cr2O7) <±0.01 A relative to calibrated sealed standard Stray Light <0.13 %T at 198 nm with KCl per EP 220 nm: <0.01%T NaI (behaves identically to KI for USP) Wavelength Accuracy ±0.20 nm (546.11 nm Hg emission line), ±0.30 nm 190–900 nm Wavelength Repeatability Peak separation of repetitive scanning of Hg line source <0.10 nm |
| Photometric Accuracy Instrument | 1A: ±0.004 A
2A: ±0.004 A 3A: ±0.006 A
Measured at 546 nm using neutral density filters traceable to NIST. When testing instrument performance, the specification used for pass/fail determination is the sum of the instrument specification listed here and the uncertainty in the calibration data for the filter, listed on the calibration certificate. |
| Photometric Display | ±6 A |
| Photometric Range | >4 A |
| Photometric Readout | Absorbance, % Transmission, % Reflectance, Kubelka-Munk, Log (1/R), Log(ABS), ABS x Factor, Intensity |
| Photometric Repeatability | 1A: ±0.0025 A |
| Scan Ordinate Modes | Absorbance, % Transmittance, % Reflectance, Concentration, 1st–4th Derivative |
| Spectral Bandwidth | Variable 0.5, 1.0, 1.5, 2.0, 4.0 nm |
| Stray Light | 198 nm: 2.9 A KCl
220 nm: 4.2 A NaI 340 nm: 4.3 A NaNO2 |
| Wavelength Accuracy | ±0.20 nm (546.11 nm Hg emission line), ±0.30 nm 190–900 nm |
| Wavelength Data Interval | 10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm |
| Wavelength Range | 190–1100 nm |
| Wavelength Repeatability | Standard deviation of 10 measurements <0.05 nm |
| Wavelength Scan Speed | 3800, 2400, 1200, 600, 240, 120, 60, 30, 10, 5, 1 nm/min
Intelliscan |
| Weight (English) | 48.5 lbs |
| Weight (Metric) | 22 kg |
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